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Patent # Description
2019/0064301 METHOD AND SYSTEM OF FREQUENCY CONSTRAINED GRADIENT WAVEFORM PRODUCTION
The present disclosure provides a method and system of magnetic resonance imaging using a constrained gradient waveform. The constrained gradient waveform is...
2019/0064300 IMAGE PROCESSING APPARATUS, MAGNETIC RESONANCE IMAGING APPARATUS, AND IMAGE GENERATING METHOD
An image processing apparatus according to an embodiment includes processing circuitry. The processing circuitry obtains a first Magnetic Resonance (MR) image...
2019/0064299 METHOD OF PERFORMING MAGNETIC RESONANCE IMAGING AND A MAGNETIC RESONANCE APPARATUS
In a method of performing magnetic resonance (MR) imaging, an MR apparatus, and a computer-readable medium during a first cardiac cycle of a subject, a first...
2019/0064298 SYSTEM AND METHOD FOR CORRECTING AN ARTIFACT WITHIN MAGNETIC RESONANCE DATA
A system for correcting an artifact within MR data is provided. The system includes a magnet assembly and a controller in electronic communication with the...
2019/0064297 METHOD OF PERFORMING MAGNETIC RESONANCE IMAGING AND A MAGNETIC RESONANCE APPARATUS
In a method of performing magnetic resonance imaging and a magnetic resonance apparatus, a region of interest in a subject in which a material having magnetic...
2019/0064296 SYSTEM, METHOD AND COMPUTER-ACCESSIBLE MEDIUM FOR HIGHLY-ACCELERATED DYNAMIC MAGNETIC RESONANCE IMAGING USING...
Exemplary method, system and computer-accessible medium can be provided which facilitates an acquisition of radial data, which can be continuous, with an...
2019/0064295 SYSTEM AND METHOD FOR DETERMINING FLIP ANGLES IN MAGNETIC RESONANCE IMAGING
A method may include providing an initial flip angle schedule of refocusing radio frequency pulses, the refocusing radio frequency pulses being configured to...
2019/0064294 METHOD OF PERFORMING MAGNETIC RESONANCE IMAGING AND A MAGNETIC RESONANCE APPARATUS
In a method of performing magnetic resonance imaging and a magnetic resonance apparatus, first MR data are acquired of a region of interest of a subject in the...
2019/0064293 SYSTEM AND METHOD FOR AMPLITUDE REDUCTION IN RF PULSE DESIGN
A system and method for modifying RF pulse generated by an MRI system are provided. The method may include: obtaining an excitation variable-rate selective...
2019/0064292 METHOD AND SYSTEM FOR MAGNETIC RESONANCE IMAGING
A method and a system for magnetic resonance imaging are provided. The method includes acquiring a magnetic resonance (MR) data set of an object by sampling...
2019/0064291 MAGNETIC RESONANCE IMAGING APPARATUS
A magnetic resonance imaging apparatus according to an embodiment is a magnetic resonance imaging apparatus including a gradient coil unit configured to...
2019/0064290 CONTRAST SYSTEM AND METHODS FOR REFLECTIVE MARKERS
A contrast system and methods for improving optical detection during a medical procedure, the system involving: at least one tracking marker, each at least one...
2019/0064289 MAGNETIC NANOPARTICLE SPECTROMETER
Disclosed are various embodiments for a system configured to characterize a magnetic response of a sample. The system can comprise an electrical source...
2019/0064288 MAGNETIC FIELD SENSOR AND METHOD OF MANUFACTURE
A magnetic field sensor that includes a differential bridge in which each path of the bridge includes a first type of magnetic field sensing device and a...
2019/0064287 FREQUENCY INCREASING SENSOR PROTOCOL IN MAGNETIC SENSING
Magnetic field sensors and sensing methods are provided. A magnetic sensor configured to measure a magnetic field whose magnitude oscillates between a first...
2019/0064286 ILLUMINATING FIXTURE AND DEVICE
An illuminating fixture and a device are provided. The illuminating fixture includes an intelligence control system, a scanning system, wires, and at least two...
2019/0064285 RELAY DIAGNOSIS CIRCUIT, DIAGNOSIS METHOD, AND BATTERY MANAGEMENT SYSTEM
A relay diagnosis circuit, diagnosis method, and battery management system are disclosed in the present disclosure. The relay diagnosis circuit may include a...
2019/0064284 APPARATUSES AND METHODS FOR TESTING ELECTROCHEMICAL CELLS BY MEASURING FREQUENCY RESPONSE
Real-time battery impedance spectra are acquired by stimulating a battery or battery system with a signal generated as a sum of sine signals at related...
2019/0064283 METHOD FOR DETERMINING THE VALUE OF PARAMETERS RELATING TO THE STATE OF AN ACCUMULATOR OF A BATTERY, BATTERY...
The invention relates to a method for determining the value of one or more parameters relating to the state of health of at least one accumulator of a battery...
2019/0064282 METHOD OF ESTIMATING DETERIORATED STATE OF SECONDARY BATTERY AND SECONDARY BATTERY SYSTEM
A method of estimating a deteriorated state of a battery includes steps S102 to S110. S102 is a step of obtaining a voltage and a current of the battery a...
2019/0064281 SENSOR MODULE AND RESIDUAL BATTERY CAPACITY MONITORING METHOD USING SENSOR MODULE
A sensor module includes a sensor, a wireless communication unit notifying a measurement value obtained by the sensor and a value based on the measurement...
2019/0064280 BATTERY DETECTION CIRCUIT AND BATTERY MANAGEMENT SYSTEM
The present disclosure provides a battery detection circuit and a battery management system. The battery detection circuit includes a positive relay, a...
2019/0064279 INSULATION DETECTION CIRCUIT, DETECTION METHOD, AND BATTERY MANAGEMENT SYSTEM
An insulation detection circuit, detection method, and battery management system are disclosed in the present disclosure. The insulation detection circuit...
2019/0064278 IMPEDANCE ESTIMATING APPARATUS
An impedance estimating apparatus is provided with: a deriving device configured to derive a slope function, on the basis of a value of a complex impedance of...
2019/0064277 METHOD AND APPARATUS FOR EVALUATING A BATTERY CELL
A method and an apparatus for evaluating a battery cell. The battery cell may include a hermetically sealed outer casing, a plurality of electrically...
2019/0064276 BATTERY STATE ESTIMATING DEVICE
A battery model includes a series connection of a direct current resistance model, a charge transfer resistance model derived from the Butler-Volmer equation,...
2019/0064275 SECONDARY BATTERY AND LIFE PREDICTION APPARATUS THEREOF
Disclosed are a secondary battery and a life prediction apparatus thereof. The life prediction apparatus predicts a life of a secondary battery including an...
2019/0064274 BATTERY CURRENT MEASUREMENT
A method of detecting a battery current in an uninterruptible power supply and a system directed to the same is provided and includes providing a battery...
2019/0064273 Relay Test Paddle
A test paddle is provided that includes a body portion having a first end and a second end. The test paddle includes a plurality of adapters provided about the...
2019/0064272 ASSEMBLED BATTERY MONITORING SYSTEM
In an assembled battery monitoring system, a voltage monitoring apparatus monitors voltages of battery cells of an assembled battery. Discharging resistance...
2019/0064271 SEQUENTIAL TEST ACCESS PORT SELECTION IN A JTAG INTERFACE
A JTAG interface in an IC includes a test mode select (TMS) pin receiving a TMS signal, a testing test access port (TAP) having a TMS signal input, a debugging...
2019/0064270 COMBINATORIAL SERIAL AND PARALLEL TEST ACCESS PORT SELECTION IN A JTAG INTERFACE
A circuit is for coupling test access port (TAP) signals to a Joint Test Action Group (JTAG) interface in an integrated circuit package. An nTRST pin receives...
2019/0064269 APPARATUS AND METHOD FOR PERFORMING A SCALABILITY CHECK ON A HARDWARE DESCRIPTION LANGUAGE REPRESENTATION OF A...
A computer implemented method, and an apparatus, are provided for performing a scalability check on a Hardware Description Language (HDL) representation of a...
2019/0064268 CLOCK SELECTION CIRCUIT AND TEST CLOCK GENERATION CIRCUIT FOR LBIST AND ATPG TEST CIRCUIT
A test circuit is operable in ATPG mode and LBIST mode. The test circuit includes a clock selection circuit. The clock selection circuit includes clock logic...
2019/0064267 GATING TAP REGISTER CONTROL BUS AND AUXILIARY/WRAPPER TEST BUS
In a first embodiment a TAP 318 of IEEE standard 1149.1 is allowed to commandeer control from a WSP 202 of IEEE standard P1500 such that the P1500...
2019/0064266 JTAG BUS COMMUNICATION METHOD AND APPARATUS
The present disclosure describes using the JTAG Tap's TMS and/or TCK terminals as general purpose serial Input/Output (I/O) Manchester coded communication...
2019/0064265 MEMORY LOOPBACK SYSTEMS AND METHODS
One embodiment of the present disclosure describes a memory system that may include one or more memory devices that may store data. The memory devices may...
2019/0064264 Circuit Arrangement For Switching Noise Jitter (SNJ) Reduction In Feedback Control Loop Circuits, And Methods...
A circuit arrangement and methods for reducing a time domain noise signature (switching noise jitter (SNJ) signature) in output and feedback paths of a...
2019/0064263 DEVICE TESTING ARCHITECTURE, METHOD, AND SYSTEM
A device test architecture and interface is provided to enable efficient testing embedded cores within devices. The test architecture interfaces to standard...
2019/0064262 TEST ARRANGEMENT AND TEST METHOD
Summarizing, the present invention relates to a test arrangement in the test method for acquiring test data in the surrounding of a device under test. At least...
2019/0064261 AUTOMATED TEST SYTEM HAVING ORTHOGONAL ROBOTS
An example test system includes a test carrier to hold devices for test; a device shuttle to transport the devices; and a robot to move the devices between the...
2019/0064260 LOW INDUCTANCE ELECTRICAL CONTACT ASSEMBLY MANUFACTURING PROCESS
A manufacturing process for an electrical contact assembly that uses an assembly jig with a middle horizontal lip adapted to fit into a plurality of C-shaped...
2019/0064259 CMOS Process Skew Sensor
Various implementations described herein are directed to an integrated circuit. The integrated circuit may include converter circuitry that operates to provide...
2019/0064258 TESTING SYSTEM FOR SEMICONDUCTOR PACKAGE COMPONENTS AND ITS THERMAL BARRIER LAYER ELEMENT
A testing system for semiconductor package components includes a testing circuit board, a test socket, at least one probe pin and a thermal barrier layer...
2019/0064257 SEMICONDUCTOR DEVICE STRUCTURES FOR BURN-IN TESTING AND METHODS THEREOF
A semiconductor device structure is provided. The semiconductor device structure includes a substrate, an electrical connection structure extending upwardly...
2019/0064256 TEST CIRCUIT, ARRAY SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE
A test circuit including: a plurality of first leads; a plurality of controllable switches each having a control terminal for receiving a control signal, a...
2019/0064255 DETECTION DEVICE AND DETECTION METHOD
The disclosure discloses a detection device and a detection method. The detection device for detecting a failure of a display device which is powered off...
2019/0064253 SEMICONDUCTOR YIELD PREDICTION
A method for predicting yield for a semiconductor process. A particular type of wafer is fabricated to have a first set of features disposed on the wafer, with...
2019/0064252 AUTOMATED TEST SYTEM HAVING MULTIPLE STAGES
An example test system includes: a test rack including test slots; first and second shuttles that are configured to move contemporaneously to transport devices...
2019/0064251 SEMICONDUCTOR TEST EQUIPMENT
A semiconductor test equipment can conduct a burn-in test, and has a testing table capable of aligning a plurality of contact units formed of a probe card...
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