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Patent # Description
US-1,025,4349 Method for predicting state of health of battery based on numerical simulation data
The present invention relates to a method for predicting the state of health of a battery based on numerical simulation data. A method for predicting the state...
US-1,025,4348 Method and apparatus for detecting abnormal state of battery
A method and apparatus for detecting an abnormal state of a battery are provided. An entropy calculator is configured to calculate an information entropy based...
US-1,025,4347 Fuel cell inspection method and manufacturing method
An inspection method for inspecting a fuel cell, comprising: rising current density at a speed of a designated speed or greater, and judging whether the fuel...
US-1,025,4346 SOC estimation device for secondary battery
A State of Charge (SOC) estimation device is provided for a secondary battery in which a correlation curve indicating a relationship between an SOC and Open...
US-1,025,4345 Battery state-of-charge estimation apparatus and state-of-charge estimation method
Final state-of-charge calculation means is provided which calculates a final state-of-charge of the battery according to state-of-charge estimate values by...
US-1,025,4344 Primary alkaline battery with integrated in-cell resistances
The invention is directed toward a primary AA alkaline battery. The primary AA alkaline battery includes an anode; a cathode; an electrolyte; and a separator...
US-1,025,4343 Layout-aware test pattern generation and fault detection
Methods and apparatuses to generate test patterns for detecting faults in an integrated circuit (IC) are described. During operation, the system receives a...
US-1,025,4342 Semiconductor device
A semiconductor device includes a first circuit and a plurality of pattern generators connected to the first circuit and each supplying a test pattern to the...
US-1,025,4341 Scan input stimulus registers, test control register controlling compressor circuitry
Testing of an electrical device is achieved by providing a test access mechanism within the device that can receive scan frames from an external tester. The...
US-1,025,4340 Independently driving built-in self test circuitry over a range of operating conditions
Embodiments are directed to a semiconductor wafer having on-wafer circuitry. The on-wafer circuitry includes functional circuitry and first drive circuitry...
US-1,025,4339 Addressable test chip test system
To improve test efficiency of addressable test chips, an addressable test chip test system includes a test equipment, a probe card and an addressable test chip,...
US-1,025,4338 Semiconductor device and corresponding debugging method
A semiconductor device, for example an integrated circuit such as a microcontroller (MCU) or a digital signal processor (DSP), includes a semiconductor die...
US-1,025,4337 System and method for establishing a trusted diagnosis/debugging agent over a closed commodity device
Systems, devices, and techniques relating to remote debugging are described. A described device includes a first processor core configured to provide an...
US-1,025,4336 Iterative N-detect based logic diagnostic technique
Techniques relate to an interactive logic diagnostic process. A diagnostic iteration loop is performed. When a critical failure does not have the diagnostic...
US-1,025,4335 Controlling a test run on a device under test without directly controlling the test equipment within a vendor...
A test controller controlled by a design entity sends at least one closed type command of a closed loop architecture test flow to an arbiter of a vendor test...
US-1,025,4334 Test circuits for integrated circuit counterfeit detection
Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be...
US-1,025,4333 Method of generating quality affecting factor for semiconductor manufacturing process and generating system for...
A quality affecting factor generation method for a semiconductor manufacturing process is provided. The method includes receiving data of a customer evaluation...
US-1,025,4332 Vibrating device for positioning a miniaturized piece in a testing accommodation, and positioning method
A for positioning a miniaturized piece includes a positioning structure that forms a first cavity designed to receive with play the miniaturized piece and a...
US-1,025,4331 Methods and apparatus for testing inaccessible interface circuits in a semiconductor device
A semiconductor IC device comprises a timing circuit to transfer a timing signal, the timing circuit being configured to receive a first test signal and to...
US-1,025,4330 Partial discharge detection bandwidth expansion through input signal aliasing
A partial discharge detection board includes a voltage divider configured to attenuate a voltage of a reflected signal. A buffer is connected to the voltage...
US-1,025,4329 Monitoring systems and methods for detecting thermal-mechanical strain fatigue in an electrical fuse
Systems and methods for detecting thermal-mechanical strain fatigue in an electrical fuse include a controller configured to monitor at least one fuse fatigue...
US-1,025,4328 Electric fence alert system
An electric fence monitoring system includes a transmission unit electrically coupled to one or more portions of an electrical fence. The transmission unit...
US-1,025,4327 Method and device for short circuit detection in power semiconductor switches
Devices and methods are provided, which detect a short circuit condition related to a semiconductor switch. A short circuit condition may be determined when a...
US-1,025,4326 Automated analysis of RF effects on electronic devices through the use of device unintended emissions
An apparatus, configured and operable to determine a state and/or an operation of a powered electrical device, comprises one or more antennas, a receiver...
US-1,025,4325 Piezoelectric field disturbance sensing system and method
A piezoelectric field disturbance sensing system includes a piezoelectric element for generating mechanical energy when electrically excited and for generating...
US-1,025,4324 Device for electric and magnetic measurements
Device for electric and magnetic measurements. In some embodiments, an electrical probe can be configured to include an unshielded inner conductor at an end of...
US-1,025,4323 Passive wireless monitoring of individual capacitor cans
A monitoring system includes a capacitor can having one or more capacitors. The monitoring system includes an antenna. The monitoring system includes at least...
US-1,025,4322 System and method for the measurement and prediction of the charging efficiency of accumulators
The invention concerns a method comprising two fundamental steps. The first one is an innovative process of characterization of the energetic efficiency...
US-1,025,4321 System for monitoring electric energy
A system for monitoring electric energy amount according to one embodiment of the present disclosure includes an electric energy system including one or more...
US-1,025,4320 Method for measuring electric power value in an hvdc system
A method for measuring electric power value in a HVDC system comprises the steps of receiving current values and voltage values, which are measured from sensor...
US-1,025,4319 Apparatus, server, system and method for energy measuring
Accordingly the embodiments herein provides a method for load balancing in an energy measurement information system. The method includes collecting, by a power...
US-1,025,4318 Systems and methods for estimating input power of an electric motor
A method of estimating an input power of a motor comprises determining an output power of the motor; determining a speed of the motor; calculating a scaling...
US-1,025,4317 Low-current circuits for supply voltage level detection
An Integrated Circuit (IC) as described herein may include a first logic circuit, a second logic circuit coupled to the first logic circuit via a level shifter,...
US-1,025,4316 Apparatus for measuring DC leakage current and method of use
An apparatus and method measures and analyzes DC current passing through a substantially insulating member or dielectric material that is electrically connected...
US-1,025,4315 Current sensor, current measuring module, and smart meter
A current sensor comprises: a plurality of magnetoresistance elements whose resistance value changes by application of an current-induced magnetic field from a...
US-1,025,4314 Current sensing circuit and integrated circuit for four-switch buck-boost convertor
A current sensing circuit used in a buck-boost converter having a pair of buck switches and a pair of boost switches, including: a first sensing circuit...
US-1,025,4313 Noncontact voltage measurement apparatus
A noncontact voltage measurement apparatus includes a sensing electrode to which a voltage corresponding to an alternating current voltage is applied, a...
US-1,025,4312 Transmission line coupler for testing of integrated circuits
The present disclosure describes a semiconductor wafer testing environment for routing signals used for testing integrated circuits formed onto a semiconductor...
US-1,025,4311 Probe card with stress relieving feature
A probe card assembly is disclosed. The probe card assembly includes a probe card plate, a probe core, and an expansion gap defined in the probe card plate. The...
US-1,025,4310 Electrical probe with a probe head and contacting pins
An electrical probe includes a main body, a probe head and a plurality of pins. The probe head is disposed on the main body, and the probe head has a surface...
US-1,025,4309 Test apparatus having a probe core with a latch mechanism
A latch assembly that can lock and unlock a probe core with respect to a circuit board is provided. The latch assembly can engage with the probe core to align...
US-1,025,4308 Electronic device testing apparatus with locking mechanism for pressing header and socket plate
An electronic device testing apparatus with a locking mechanism for locking a press head and a socket plate is provided. When an electronic device is to be...
US-1,025,4307 Scanning probe microscope
A scanning probe microscope includes: a laser source 61; a photodetector 62; and a Y-drive mechanism 701 provided for at least either the laser source 61 or...
US-1,025,4306 Probe calibration or measurement routine
A method of performing a measurement routine on a probe, the probe comprising a cantilever extending from a support. An interferometer is operated to reflect a...
US-1,025,4305 Inertial sensor
An inertial sensor includes a base portion, a weight portion, a connection portion, and a first sensing element unit. The connection portion connects the weight...
US-1,025,4304 Opto-mechanical physical sensor with an improved sensitivity
A physical sensor comprising a substrate, a movable mass, said mass being able to be moved by an external force, a first optical resonator, a light wave guide...
US-1,025,4303 Twist independent mounting of a wheel speed sensor using a differential magnetoresistive sensor
A magnetic sensor may include a first sensing element and a second sensing element. The first sensing element may be capable of sensing a first component of a...
US-1,025,4302 Method for clinical examinations and cleaning method therefor
An method is offered which can clean the nozzles of a reaction cuvette wash unit. A first detergent is put in first reagent containers located on a first...
US-1,025,4300 Analyzer and method for loading a rack into a rack slot of an analyzer
An analyzer is disclosed. The analyzer comprises a rack slot configured to receive at least one rack, wherein the rack slot comprises a front end, at which the...
US-1,025,4299 Multiple slot place and pick carrier
An automation system for use with in-vitro diagnostics includes a plurality of fluid containers configured to hold one or more fluids. The system includes a...
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